ISO Event Registration- Rotterdam
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Presented by Alex T. Lau
Overview of the normal distribution and standard deviation concepts
Repeatability, reproducibility, and Site (system) Precision
Various forms of Bias
Site Expected Value (SEV) & Accepted Reference Value (ARV)
Bias assessment for a laboratory
Alex T. Lau, President of TCL-Consulting and Chairman of ASTM D02.94 Subcommittee on Quality Assurance and Statistics, to present his Introductory Training Course on Understanding Test Method Precision, Bias, and SQC Charts. The virtual class will be in the format of two 90 minutes sessions per day over two days.
Daily sessions: 1 PM - 2:30; 3 - 4:30 PM CEST (GMT+2) | 7 AM - 8:30; 9 - 10:30 AM EDT (GMT-4); with a 30 minute break between each session.
Precision Fundamentals
Bias Fundamentals
In-Statistical-Control Fundamentals
Who should attend?
To register, click here.
Cost is $0 per person.
For more information, email
Presented by Alex T. Lau
Cloud based QC/PLUS system provided for hands-on practice
Statistical thinking, Test method precision, bias, SQC theory and practical application
Special emphasis on work process and measurement system improvement
Precision, bias, ILCP/PTP, alternative limits – all are included
Valuable learning for labs of all types and sizes
Alex T. Lau will present his ISO 4259-4 Training Course on use of Statistical Quality Control Charts (SQC) for test method quality assurance. Students will be provided a cloud based, hands-on SQC Exercise System to use Baytek’s QC/PLUS™ software throughout the course. The class will be 8:30 AM – 4:00 PM CEST.
Course Motivation
Since trustworthy measurement data is a fundamental enabler to all aspects of business improvement, having a fundamental understanding of testing precision, data quality, how to design and execute control chart work processes to ensure data quality, and the implicit uncertainties associated with measurement data can significantly enhance business process improvement initiatives.
Understanding test method and measurement system performance and behavior from control charts can lead to correct decisions as to when to adjust and when not to adjust measurement systems or process control strategies.
Use of control charts to monitor measurement system performance and apply preemptive just-in-time failure-prevention actions can improve laboratory and field operations efficiency, reduce waste, and assure the test data produced are fit-for-use and defensible.
Understanding of test method precision enables release of product with confidence at optimal production cost.
Who should attend?
Course Format:
Baytek’s industry leading QC/PLUS workflow solution for SQC will be prominently featured during the course. Students will gain valuable insights into good laboratory practices and practical application of the principles of SQC. Baytek SME’s will participate in the course and be available for Q&A throughout the week.
Bonus: Students will be granted access to the QC/PLUS training site for two weeks following the completion of the course.
To register, click here.
Cost is $0 per person.
For more information, email
PREREQUISITES This course is for experienced BLISS LIMS Managers that are already familiar with cBLISS use cases and configuration.
DESCRIPTION
LOCATION:
SCHEDULE: May 29-31
This course is intended to train LIMS Managers on BLISS40 and give insight into the migration project for expectation setting and planning purposes. Students will be provided course materials and manuals.
To register, click here.
Cost is $2,750 per person.
For more information, email