Understanding Test Method Precision, Bias, Statistical Quality Control Charts

Class Space is Limited

May 21-22


VIRTUAL EXPERIENCE
1 - 4:30pm CEST (GMT+2)
7 - 10:30am EDT (GMT-4)

Presented by Alex T. Lau

Overview of the normal distribution and standard deviation concepts

Repeatability, reproducibility, and Site (system) Precision

Various forms of Bias

Site Expected Value (SEV) & Accepted Reference Value (ARV)

Bias assessment for a laboratory

Coming Again Soon

Alex T. Lau, President of TCL-Consulting and Chairman of ASTM D02.94 Subcommittee on Quality Assurance and Statistics, to present his Introductory Training Course on Understanding Test Method Precision, Bias, and SQC Charts. 

Precision Fundamentals

  • Overview of the Normal distribution and standard deviation concepts
  • Provide simple explanation on the meaning of test method repeatability (r), reproducibility (R), and site (system) precision (R')
  • How r & R are estimated using ILS
  • How r & R information is presented in test methods
  • Simple applications of r, R, R'

Bias Fundamentals

  • Various forms of Bias
  • Site Expected Value (SEV) & Accepted Reference Value (ARV)
  • Bias assessment for a laboratory

In-Statistical-Control Fundamentals

  • Basic statistical theory, concept, and work process for test method statistical control charts
  • Demo of control chart work process execution (Stage 1,2) using QC/PLUS

Who should attend?

  • Lab technicians
  • Lab QA/QC personnel
  • Lab managers
  • Personnel involved with product quality assurance and regulatory compliance testing

Cost is $0 per person.

Join the Program